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authorRobin Krahl <robin.krahl@ireas.org>2019-01-16 19:35:50 +0000
committerRobin Krahl <robin.krahl@ireas.org>2019-01-16 21:22:31 +0100
commitd3a103bc25e5f37a42a19515ad25e5a8e5995b36 (patch)
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Make device::factory_reset test more robust
The device::factory_reset test used to first change the PINs and then access the PWS and the OTP data. If for example the PWS access failed due to an problem with the AES key, the PINs were not reset. Now we perform the PWS and OTP access with the old PINs – which is okay as we do not want to test the PIN change but the factory reset. If these preparations fail, the tests is cancelled before the PINs are changed.
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